NEWS & EVENTS
Press Releases
ADVISORY/ VaST Systems to Demonstrate Virtual System Prototyping at Embedded Technology Conference in Japan
SUNNYVALE, California, November 8, 2006--VaST Systems— the technology leader in embedded design —today announced that VaST K.K., its subsidiary in Tokyo, Japan, and
VaST’s Japanese distributor, GAIA Systems Solutions, will demonstrate VaST’s virtual system prototyping solutions at the Embedded Technology 2006 Conference in Yokohama, Japan, on November 15-17, 2006.
WHO: VaST Systems Technology Corp.
WHAT: VaST will demonstrate its cycle-accurate, high-performance virtual system prototyping solutions for mission-critical silicon embedded systems.
WHERE: Embedded Technology Conference 2006, Pacifico Yokohama, Japan. This conference introduces advanced technologies and solutions for emerging embedded applications, including digital consumer electronics, automotive, wireless/ ubiquitous computing and factory automation. For more information, see http://www.jasa.or.jp/et/english/.
WHEN: November 15th through 17th, 2006.
About VaST
VaST Systems Technology Corporation solutions enable the creation of a virtual system prototype—a cycle-accurate software model of a system that operates at near real-time speeds under actual software loads. VaST’s solutions are OSCI SystemC-compliant and are used for architecture, hardware and software design. VaST solutions dramatically improve time to market and quality while reducing development costs and risk.
Current customers include worldwide leaders in semiconductors, automotive electronics, wireless devices, and consumer electronics. VaST is headquartered in Sunnyvale, California with sales and support offices worldwide. For more information, visit www.vastsystems.com.
Media Contacts:
VaST in the USA:
Linda Marchant
Cayenne Communication
Phone: +1 919 451 0776
E-mail: linda.marchant@cayennecom.com
VaST in Europe:
Peter van der Sluijs, Neesham Public Relations
phone: +44 (0) 1296 628180
e-mail: peterv@neesham.co.uk
Learn Why VaST Technology Is Unique
Learn more >>
